ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2016/01
Type Academic Journal
Peer Review Peer reviewed
Title Self-heating Induced Instability of Oxide Thin Film Transistors under Dynamic Stress
Contribution Type Collaboration
Journal Appl. Phys. Lett.
Journal TypeAnother Country
Volume, Issue, Page 105,pp.023501-1-4
Author and coauthor Kahori Kise, Mami N. Fujii, Satoshi Urakawa, Haruka Yamazaki,Emi Kawashima, Shigekazu Tomai, Koki Yano, Dapeng Wang, Mamoru Furuta, Yasuaki Ishikawa, and Yukiharu Uraoka
DOI 10.1063/1.4939861