ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2015/09
Type Academic Journal
Peer Review Peer reviewed
Title Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation
Contribution Type Collaboration
Journal J. Display Technol.
Journal TypeAnother Country
Volume, Issue, Page 12,pp.263-267
Author and coauthor Chaiyanan Kulchaisit, Yasuaki Ishikawa, Mami N. Fujii, Haruka Yamazaki, Juan P. Bermundo, Satoru Ishikawa, Takaaki Miyasako. Hiromitsu Katsui, Kei Tanaka, Ken-ichi Hamada, Masahiro Horita, and Yukiharu Uraoka
DOI 10.1063/1.4931951