ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2013/02
Type Academic Journal
Peer Review Peer reviewed
Title Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect
Contribution Type Collaboration
Journal Appl. Phys. Lett.
Journal TypeAnother Country
Volume, Issue, Page 102(5),pp.53506-1-4
Author and coauthor Satoshi Urakawa, Shigekazu Tomai, Yoshihiro Ueoka, Haruka Yamazaki, Masashi Kasami, Koki Yano, Dapeng Wang, Mamoru Furuta, Masahiro Horita, Yasuaki Ishikawa, Yukiharu Uraoka
DOI 10.1063/1.4790619