ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2011/09
Type Academic Journal
Peer Review Peer reviewed
Title Unique Phenomenon in Degradation of Amorphous In2O3-Ga2O3-ZnO Thin-Film Transistors under Dynamic Stress
Contribution Type Collaboration
Journal Appl. Phys. Express
Journal TypeAnother Country
Volume, Issue, Page 4,pp.104103-1-3
Author and coauthor Mami Fujii, Yasuaki Ishikawa, Masahiro Horita, Yukiharu Uraoka
DOI 10.1143/APEX.4.104103