ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2020/07
Type Academic Journal
Peer Review Peer reviewed
Title Improvement in bias stress stability of solution-processed amorphous InZnO thin-film transistors via low-temperature photosensitive passivation
Contribution Type Collaboration
Journal IEEE Electron Dev. Lett.
Journal TypeAnother Country
Volume, Issue, Page 41,pp.1372-1375
Author and coauthor Aimi Syairah Safaruddin, Juan Paolo S. Bermundo, Naofumi Yoshida, Toshiaki Nonaka, Mami N. Fujii, Yasuaki Ishikawa, and Yukiharu Uraoka
DOI https://doi.org/10.1109/LED.2020.3011683