ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2020/04
Type Academic Journal
Peer Review Peer reviewed
Title Unique degradation under AC stress in high-mobility amorphous In-W-Zn-O thin-film transistors
Contribution Type Collaboration
Journal Appl. Phys. Express
Journal TypeAnother Country
Author and coauthor Takanori Takahashi, Mami Fujii, Ryoko Miyanaga, Miki Miyanaga, Yasuaki Ishikawa, Yukiharu Uraoka
DOI 10.35848/1882-0786/ab88c5