ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2019/08
Type Academic Journal
Peer Review Peer reviewed
Title Effective minority carrier lifetime as an indicator for potential-induced degradation in p-type single-crystalline silicon photovoltaic modules
Contribution Type Collaboration
Journal Jpn. J. Appl. Phys.
Journal TypeAnother Country
Volume, Issue, Page 58,pp.106507-1-10
Author and coauthor Mohammad Aminul Islam, Dong Chung Nguyen, and Yasuaki Ishikawa
DOI 10.7567/1347-4065/ab3f06