ISHIKAWA Yasuaki
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2019/05
Type Academic Journal
Peer Review Peer reviewed
Title Highly Reliable Low-Temperature (180oC) Solution-Processed Passivation for Amorphous In-Zn-O Thin-Film Transistors
Contribution Type Collaboration
Journal Appl. Phys. Express
Journal TypeAnother Country
Volume, Issue, Page 12,pp.064002-1-5
Author and coauthor Aimi Syairah Safaruddin, Juan Paolo Bermundo, Naofumi Yoshida, Toshiaki Nonaka, Mami N. Fujii, Yasuaki Ishikawa, and Yukiharu Uraoka
DOI 10.7567/1882-0786/ab1726