KOH Shinji
   Department   Aoyama Gakuin University  Department of Electrical Engineering and Electronics, College of Science and Engineering
   Position   Professor
Language English
Publication Date 2004/08
Type Academic Journal
Peer Review Peer reviewed
Title Strain relaxation and induced defects in SiGe thin films grown on ion- implanted Si substrates
Contribution Type Collaboration
Journal Material Transactions
Journal TypeAnother Country
Volume, Issue, Page 45,pp.2644-2646
Author and coauthor J. Yamanaka, K. Sawano, K. Nakagawa, K. Suzuki, Y. Ozawa, S. Koh, T. Hattori and Y. Shiraki